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Home Page arrow News arrow Seminar on the Principles and Techniques of Atomic Force Microscopy
Seminar on the Principles and Techniques of Atomic Force Microscopy
Post Department:Center for Advanced Processing and Analysis      Post Date:2023-09-27  

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Our esteemed Center for Advanced Processing and Analysis is delighted to announce a seminar scheduled for November 25, 2023 (Saturday), from 13:30 to 17:00. We have the honor of hosting Dr. Lin Fan-Yan, an Applied Scientist from the Nanosurface Business Group of Taiwan's Bruker Life Sciences Corporation. The focus of the seminar will be on the Atomic Force Microscope (AFM, DIMENSION ICON XR) housed in our center. The seminar will be divided into two segments: the first will elucidate the operational principles of the Atomic Force Microscope and its common measurement modes, while the second will delve into advanced operational modes and practical analysis of the Atomic Force Microscope.

Those interested in participating are kindly requested to register via the following link: https://webapp.yuntech.edu.tw/Activities/Activities/Details?activityID=73465. The registration period is from October 1, 2023, to November 22, 2023. Please note that there is no registration fee. However, the number of participants is limited, and a small number of on-site registration slots will be available on the day of the seminar.

Should you have any queries, please do not hesitate to contact us via email or by calling the Center for Advanced Processing and Analysis at 05-5342601, extension 2813 (Technician Xie Zhi-Xuan).

With warm regards,
Director Mao Wei-Long
Center for Advanced Instrumentation Center
National Yunlin University of Science and Technology